Nanotechnology Standards

Four focus on electrical applications of nanomaterials

6 December 2013

The IEEE Nanotechnology Council has written four standards designed to help measure, report, test, and characterize nanomaterials for electrical and electronic products and systems.

IEEE 1650-2005
Approved December 2005

The “Standard for Test Methods for Measurement of Electrical Properties of Carbon Nanotubes” recommends techniques and reporting practices for the electrical characterization of nanotubes. The standard was adopted in 2009 by the International Electrotechnical Commission as IEC/IEEE 62624.

IEEE 1620-2008
Approved September 2008

The “Standard for Test Methods for the Characterization of Organic Transistors and Materials” defines a process for defining organic electronic devices, including measurement techniques, methods of reporting data, and test conditions. The standard was adopted this year by the IEC as IEC/IEEE 62860.

IEEE 1620.1-2006
Approved June 2006

The “IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators” recommends procedures and reporting practices for electrical classification of printed and organic oscillators. The standard was adopted this year by the IEC as IEC/IEEE 62860-1.

The following standard is under development in collaboration with IEC Technical Committee 113, a group that works on nanotechnology standardization for electrical and electronic products and systems. If approved by the IEEE Standards Association Standards Board, it will be released next year.

IEC/IEEE 62659
The “Standard for Large-Scale Manufacturing for Nanoelectronics” defines processes for incorporating nanomaterials in electronic products, enabling mass production of items such as nanostructured sensors and magnetic materials and devices.


For more information on these and other standards, visit IEEE Standards Web page.

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